Scientific equipment | ХАІ
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Scientific equipment
of the center for collective use of scientific equipment
«Creation and research of aerospace objects and systems»

The center for collective use of scientific equipment "Creation and research of aerospace objects and systems" of the National Aerospace University "Kharkiv Aviation Institute" has the following equipment:

Signal generator R&S SMB100A-B140

The R&S SMB100A signal generator with the B140 option is designed for shaped microwave oscillations in the frequency range from 100 kHz to 40 GHz.

In addition to sinusoidal signals, it also generates the most common analog signals with amplitude, frequency and phase modulation. The device can be used to generate pulse signals.

The presence of a mechanical step attenuator with systematic step adjustment allows you to quickly adjust the frequency or output power level. The low time of setting the parameters of the measuring device helps to increase the productivity.

It is possible to control the device using the software installed on the computer.

Some technical characteristics of the device:

  • frequency range from 100 kHz to 40 GHz;
  • dynamic range from -120 dBm to +8 dBm;
  • level error less than 0.5 dB;
  • level setting time no more than 2.5 ms;
  • phase noise no more than -122 dB;
  • support for amplitude, frequency and phase modulation modes.




Milling machine with numerical software control and additional laser equipment

Technical characteristics of the machine:

  • working stroke 2500x1500 mm
  • spindle 1500 W, maximum revolutions 24000 rpm
  • Raycus RFL 1000 laser source
  • optical head for laser metal cutting with motion and height control system




Scanning electron microscope REM-106 with a low vacuum chamber and energy dispersive microanalysis system

It is intended for the study of the surface relief of various objects in the solid phase and the determination of the elemental composition of objects by the method of X-ray microanalysis based on the energies of the quanta of characteristic radiation in two modes: high and low vacuum.

In the mode of low adjustable vacuum, the microscope, with the help of a highly efficient detector of reflected electrons, provides the study of dielectric samples, the image of which in high vacuum is distorted by the accumulation of the charge of electrons of the primary beam. In the low adjustable vacuum mode, images of semiconductors, ceramics, polymers, glass, wood, paints and other non-conductive materials can be obtained without prior sputtering.

Studying objects in secondary electrons provides topographic contrast. In reflected electrons - elemental contrast.

The device allows to carry out qualitative and quantitative elemental analyzes of the studied area of the studied object.

It is possible to conduct a study of changes in the concentration of elements along a line specified by the operator in automatic mode.

Some technical characteristics of the device:

  • Resolution in secondary electrons in the high vacuum mode is not worse than 4 nm;
  • Resolution in secondary electrons in the low vacuum mode is not worse than 6 nm;
  • Magnification change range from 15 times to 300,000 times;
  • The range of analyzed elements in high vacuum is from 5V to 92U;
  • The range of analyzed elements in low vacuum is from 12Mg to 92U;
  • The resolution of the X-ray energy spectrometer on the Mn Kα line is no more than 143 eV.




Transmitting electronic microscope PEM 100-01 with mini-lenses

It is intended for carrying out studies of the microstructure and phase composition of objects, provides visual observation and photography of the image of the object in a wide range of magnifications, obtaining a diffraction pattern from objects. Some technical characteristics of the device:

  • The crystal lattice resolution is 0.34 nm, and the points are 0.4 nm;
  • The range of electron-optical magnification is from 50 to 600,000 times;
  • The effective length of the diffraction chamber is from 200 to 2000 mm.




Large photomicroscope of reflected light NEOPHOT-30

NEOPHOT-30 (Carl Zeiss) optical microscope of reflected light for studying the surface structure of solid samples. Designed for metallographic and ore microscopy and creating photographs in the magnification range from 10x to 2000x. Observation can be carried out by the method of bright and dark field, as well as in polarized light.





DRON-3M - X-ray diffractometer is designed for conducting a wide range of X-ray structural studies of various crystalline materials, including determination of the type and parameters of the crystal lattice.





Vacuum universal post VUP-5M

The VUP-5M universal vacuum post is designed to achieve the vacuum in the working volume necessary for applying films from various materials using the post using methods of magnetron, resistive and electronic sputtering, as well as etching materials in plasma, preparing objects examined with the help of electronic microscope.






Disperser ultrasonic UZDN-А

Intended for preparation of objects from fibrous, crystalline, powdery and other substances during electron microscopic studies in biology, chemistry, medicine, mineralogy, metallurgy and other fields of science.

In addition to its main purpose, the dispersant can be used to obtain suspensions and emulsions from various substances, washing small parts from mechanical contamination.





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