Scientific Equipment of the Center for Collective Use of Scientific Equipment

The R&S SMB100A signal generator with option B140 is designed for generating microwave oscillations in the frequency range from 100 kHz to 40 GHz.

In addition to sinusoidal signals, it also generates the most common analog signals with amplitude, frequency, and phase modulation. The device can be used to generate pulsed signals.

The presence of a mechanical step attenuator with system step adjustment allows for rapid frequency or output power level switching. The low settling time of the measuring instrument's parameters contributes to increased productivity.

The device can be controlled using software installed on a computer.

Key technical specifications:

• frequency range from 100 kHz to 40 GHz;
• dynamic range from -120 dBm to +8 dBm;
• level error less than 0.5 dB;
• level settling time not more than 2.5 ms;
• phase noise not more than -122 dBc;
• support for amplitude, frequency, and phase modulation modes.

Technical specifications:

• working stroke 2500x1500 mm;
• 1500 W spindle, maximum speed 24000 rpm;
• Raycus RFL 1000 laser source;
• optical head for laser metal cutting with motion and height control system.

Designed for studying the surface relief of various solid-phase objects and determining the elemental composition of objects using X-ray microanalysis based on characteristic radiation quantum energies in two modes: high and low vacuum.

In the regulated low-vacuum mode, the microscope, using a high-efficiency backscattered electron detector, enables the study of dielectric samples whose images in high vacuum are distorted by the accumulation of charge from the primary electron beam. In low-vacuum mode, images of semiconductors, ceramics, polymers, glass, wood, paints, and other non-conductive materials can be obtained without prior sputter coating.

Observation of objects in secondary electrons provides topographic contrast, while backscattered electrons provide elemental contrast.

The instrument allows for qualitative and quantitative elemental analysis of the investigated area of the object.

There is an option to automatically conduct studies of changes in element concentration along a line specified by the operator.

Key technical specifications:

• Secondary electron resolution in high-vacuum mode: not worse than 4 nm;
• Secondary electron resolution in low-vacuum mode: not worse than 6 nm;
• Magnification range: from 15x to 300,000x;
• Range of analyzed elements in high vacuum: from ₅B to ₉₂U;
• Range of analyzed elements in low vacuum: from ₁₂Mg to ₉₂U;
• X-ray energy spectrometer resolution at the Mn Kα line: not more than 143 eV.

Designed for research on the microstructure and phase composition of objects, providing visual observation and photography of object images across a wide range of magnifications, and obtaining diffraction patterns from objects.

Key technical specifications:

• Resolution: lattice - 0.34 nm, point-to-point - 0.4 nm;
• Electron-optical magnification range: from 50 to 600,000 times;
• Effective diffraction camera length: from 200 to 2000 mm.

The VUP-5M universal vacuum station is designed to achieve the vacuum level in the working volume necessary for applying films of various materials using magnetron, resistive, and electron evaporation methods, as well as plasma etching of materials and preparing objects studied with an electron microscope.

Designed for preparing objects from fibrous, crystalline, powdered, and other substances for electron-microscopic research in biology, chemistry, medicine, mineralogy, metallurgy, and other scientific fields.

In addition to its main purpose, the disintegrator can be used to obtain suspensions and emulsions from various substances and to clean small parts from mechanical contamination.