REM-106 Scanning Electron Microscope with Low Vacuum Camera and Energy Dispersive Microanalysis System (Selmi, Sumy)
Designed for studying the surface relief of various objects in the solid phase and determining the elemental composition of objects using X-ray microanalysis based on the energy of characteristic radiation quanta in two modes: high vacuum and low vacuum.
In the regulated low vacuum mode, the microscope uses a high-efficiency backscattered electron detector to study dielectric samples, whose images in high vacuum would be distorted by the accumulation of charge from the primary electron beam. In this mode, images of semiconductors, ceramics, polymers, glass, wood, paints, and other non-conductive materials can be obtained without prior sputter coating.
Study of objects in secondary electrons provides topographic contrast, while backscattered electrons provide elemental contrast.
The device allows for qualitative and quantitative elemental analysis of the specific area of the object under study.
It is possible to conduct research on changes in element concentration along a line specified by the operator in automatic mode.
Technical Specifications:
1. Resolution in secondary electrons (high vacuum mode): not more than 4 nm;
2. Resolution in backscattered electrons (low vacuum mode): not more than 6 nm.
3. Magnification range: from 15x to 300,000x.
4. Range of analyzed elements in high vacuum: from 5B to 92U.
5. Range of analyzed elements in low vacuum: from 12Mg to 92U.
6. Resolution of the X-ray energy-dispersive spectrometer at the Mn Kα line: not more than 129 eV (XR-100FASTSDD detector by Amptek, USA).
PEM 100-01 Transmission Electron Microscope with Mini-lenses (Selmi, Sumy)
Designed for research on the microstructure and phase composition of objects. It allows for visual observation and photography of object images across a wide magnification range and obtaining diffraction patterns from objects.
Technical Specifications:
1. Resolution: by crystal lattice – 0.34 nm, by points – 0.4 nm.
2. Range of electron-optical magnification: from 50x to 600,000x.
3. Effective length of the diffraction camera: from 200 to 2000 mm.
NEOPHOT-30 Large Reflected Light Photomicroscope
The NEOPHOT-30 (Carl Zeiss) is an optical reflected light microscope for studying the surface structure of solid-state samples. It is intended for metallographic and ore microscopy and creating photographs in the magnification range of 10x to 2000x. Observation can be carried out using brightfield and darkfield methods, as well as in polarized light.
DRON-3M X-ray Diffractometer
The DRON-3M is a general-purpose X-ray diffractometer used for a wide range of X-ray structural studies of various crystalline materials, including determining the type and parameters of the crystal lattice.
VUP-5M Universal Vacuum Post (also VUP-2K available) (Selmi, Sumy)
The VUP-5M universal vacuum post is designed to create a vacuum in the working volume necessary for depositing films from various materials using magnetron, resistive, and electron-beam sputtering methods, as well as plasma etching of materials and preparation of objects for electron microscopy.
UZDN-A Ultrasonic Disintegrator (Selmi, Sumy)
Designed for preparing objects from fibrous, crystalline, powdered, and other substances for electron-microscopic studies in biology, chemistry, medicine, mineralogy, metallurgy, and other fields of science. In addition to its main purpose, the disintegrator can be used to obtain suspensions and emulsions from various substances and for cleaning small parts from mechanical contaminants.